Non-destructive determination of phase, size, and strain of individual grains in polycrystalline photovoltaic materials

The non-destructive structural characterization of individual grains in thin-films photovoltaics based on polycrystalline materials is a powerful tool for revealing important details the microstructure solar cell absorbers. Here, we use three-dimensional X-ray diffraction (3DXRD) to obtain statistics phase, size, orientation and strain tensors grains, as well their twin relations Cu2ZnSnS4 (CZTS) Moreover, this approach allows non-ambiguous determination phases with distinct optical electrical properties but similar lattice parameters, such CZTS ZnS. Our analysis over cumulative nearly 600 reveals that fraction 2.5% corresponds ZnS secondary phase. Statistics distribution layer indicate an average tensile stress plane film ~70 MPa compressive along normal ~145 MPa. We found 41% total number absorbers are ?3 twins. calculate frequency six types boundaries, 180° rotation axis<221>is most frequent. Accessing opens possibility study its influence film, bandgap variations due or role boundaries charge transport mechanisms.